Atomic Force and Scanning Probe Microscopy - With the NANOS N8 Series

Bruker Nano provides Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) products that stand out from other commercially available systems for their robust design and ease-of-use, whilst maintaining the highest resolution. The NANOS measuring head, which is part of all our instruments, employs a unique fiber-optic interferometer for measuring the cantilever deflection, which makes the setup so compact that it is no larger than a standard research microscope objective.

The firm basis for the quality of our microscopes is a team of experienced scientist and engineers with a background of more than 15 years in the AFM business.

NANOS

NANOS
Upgrade your existing optical microscope to an AFM

N8 ARGOS
The compact AFM/SPM for research and education

The new N8 NEOS

N8 NEOS
Research grade optical microscope and AFM combination

N8 RADOS

N8 RADOS
The perfect tool for automated optical & AFM sample inspection

N8 TITANOS

N8 TITANOS
Automated large sample AFM platform

NEOS SENTERRA

N8 NEOS SENTERRA
Combined AFM and Raman spectrometer


More Information

AFM Features - NANOS AFM / SPM products

AFM Techniques - Instruments equipped with a number of different scanning modes

NANOS N8 Series – Scanning Probe Microscopes (PDF brochure)