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LEPTOS is a comprehensive software suite, the unified and self-contained software for the analysis of X-ray reflectometry (XRR), High-Resolution X-ray Diffraction (HRXRD) including Grazing-Incidence Diffraction (GID), Residual Stress (RS) and Grazing-Incidence Small-Angle X-ray Scattering (GISAXS).

The modular philosophy of the package allows the consistent evaluation of the measurements in different geometries and setups. The comprehensive analysis of multiple data within a single shell gives user an advantage of similar functionality and operation for various applications and provides an unique evaluation model for different probing methods. Ergonomic design, several levels of user’s expertise, a diversity of implemented scientific models, patented and published approaches and theories make LEPTOS an unique tool for the interpretation of the results.

LEPTOS fits well both academic and industrial applications. The expert level of the user’s interface opens an access to the various physical parameters and models, whereas the beginner’s user level makes an evaluation procedure simple and intuitive. LEPTOS offers the wide automated abilities for the simulations, data fitting and estimation for all applications.

The most prominent features of LEPTOS are:

• Joint evaluation of multiple XRR, HRXRD, GISAXS and RS measurements: All information integrated into one solution
• Dual evaluation approaches: fast estimation mode based on the simplified theories and precise fitting mode for robust evaluation of the physical parameters
• Advanced X-ray scattering theories and numerical methods, published in high-rated scientific journals, patented and implemented in the package
• Naturally integrated processing of the 1- and 2-dimensional data sets measured by point, line and two-dimensional detectors
• Comprehensive unified for all applications Material Data Base with all 230 crystallographic space groups: every amorphous and crystalline material covered
• All evaluation stored in a single XML project file: Easy continuation of evaluations and traceability of the results
• Area mapping tool for display and evaluation of the measurements performed over large sample areas
• 4 fit algorithms including patented eXtended Genetic Algorithm: Stable or time optimized selection of fit method
• Accounting of instrumental effects during the evaluation procedures
• Extended tools for automated data treatment: One-Button operation for routine evaluations
• Advanced tool for peak search and evaluation
• Predefined print reports and customizable export: Straightforward documentation and publication of results
• and more…

The analytical and numerical methods and novel physical approaches implemented into LEPTOS suit are protected by 5 patents and have been published in world-recognized scientific journals:

[1] I.D.Feranchuk, L.I.Komarov, I.V.Nichipor and A.P.Ulyanenkov, Annals of Physics, NY 228 (1995) 370-440.

[2] A.P.Ulyanenkov, S.A.Stepanov, U.Pietsch and R.Köhler, J.Phys.D:Appl.Phys, 28 (1995) 2522.

[3] I.D.Feranchuk, L.I.Gurskii, L.I.Komarov, O.M.Lugovskaya, F.Burgäzy and A.Ulyanenkov, (2002) Acta Cryst. A58, pp.370-384;

[3] I.D.Feranchuk, A.A.Minkevich and A.Ulyanenkov, Eur.Phys.J.AP 19 (2002) 95-101.

[4] I.D.Feranchuk, S.I.Feranchuk, A.A.Minkevich and A.Ulyanenkov, Phys.Rev. B, 68 (2003) 235307

[5] I.D.Feranchuk, S.I. Feranchuk, L.I. Komarov, S.I. Sytova, A.P. Ulyanenkov, Phys.Rev.B 67 (2003) 235417

[6] I.D.Feranchuk, A.A.Minkevich and A.Ulyanenkov, Eur. Phys. J. Appl. Phys, 24 (2003) 21

[7] A.Ulyanenkov, Proc.of SPIE, 5536 (2004) 1---15

[8] A.Ulyanenkov and S.Sobolewski, J. of Physics D: Appl.Phys, 38 (2005) 235

[9] A.Ulyanenkov, Applied Surface Science, 253 (2006) 106

[10] I.D.Feranchuk, S.I.Feranchuk, and A.P.Ulyanenkov, Phys.Rev.B 75 (2007) 085414