DIFFRAC^plus Software Solutions für X-ray Powder Diffraction

DIFFRAC^plus is a suite of software packages for data acquisition and analysis, covering all powder diffraction application areas in industry and research. Like no other vendor's software package, DIFFRAC^plus has introduced numerous most significant scientific innovations into the powder diffraction community, making them available for routine use even in fully automated environments.

Since more than one decade, DIFFRAC^plus is the benchmark software package in powder diffraction, and has been frequently acknowledged in literature as the most innovative software package by internationally known and respected experts. It also performed best in international round robins, e.g. TOPAS for ab-initio structure determination, and SEARCH for phase identification.

BASIC Measurement Package - Instrument control and data acquisition

EVA - Qualitative and semi-quantitative phase analysis

SEARCH - Phase identification

BASIC Part11 - Part11 compliant data acquisition and evaluation

TOPAS - Profile analysis, quantitative analysis, structure analysis

LEPTOS - Thin film analysis

ELASTIX - Calculation of the X-ray elastic constants (XEC)

TEXTURE, ODF, MULTEX - Texture analysis of 1- and 2-dimensional datasets

STRESS - Residual stress investigation

PolySNAP, dSNAP - Pattern matching for high-throughput phase analysis

GADDS - 2-dimensional data acquisition and evaluation